Geometric deep learning for enhanced quantitative analysis of microstructures in X-ray computed tomography data

被引:0
|
作者
Lapenna, M. [1 ]
Tsamos, A. [2 ,3 ]
Faglioni, F. [4 ]
Fioresi, R. [5 ]
Zanchetta, F. [5 ]
Bruno, G. [2 ,3 ]
机构
[1] Unibo, DIFA, Via Irnerio 46, I-40126 Bologna, Italy
[2] BAM, Bundesanstalt Materialforsch & Prufung, Unter Eichen 87, D-12205 Berlin, Germany
[3] Univ Potsdam, Inst Phys & Astron, Karl Liebknecht Str 24-25, D-14476 Potsdam, Germany
[4] Unimore, DGSC, Via Campi 103, I-41100 Modena, Italy
[5] Unibo, Fabit, Via San Donato 15, I-40127 Bologna, Italy
关键词
Geometric deep learning; Segmentation; Microstructure; X-ray computed tomography; Al-Si metal matrix composites;
D O I
10.1007/s42452-024-05985-0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Quantitative microstructural analysis of XCT 3D images is key for quality assurance of materials and components. In this paper we implement a Graph Convolutional Neural Network (GCNN) architecture to segment a complex Al-Si Metal Matrix composite XCT volume (3D image). We train the model on a synthetic dataset and we assess its performance on both synthetic and experimental, manually-labeled, datasets. Our simple GCNN shows a comparable performance, measured via the Dice score, to more standard machine learning methods, but uses a greatly reduced number of parameters (less than 1/10 of parameters), features low training time, and needs little hardware resources. Our GCNN thus achieves a cost-effective reliable segmentation. We present a novel Graph Convolutional Neural Network approach to segment a 3D image of a complex Al-Si Metal Matrix composite. Training on synthetic datasets shows a semantic understanding of the ground truth labels of manually-labeled experimental images. Our simple Graph Neural Network shows a comparable performance to standard methods, using a reduced number of parameters, low training time, towards cost-effective reliable segmentation.
引用
收藏
页数:9
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