Application of virtual instrument in automatic test of high-speed mixed signal

被引：0

作者：

Xue, Lian ^{[1
]}

Hu, Cheng-Song ^{[1
]}

机构：

[1] WuHan Technology And Business University, Wuhan,430065, China

来源：

International Journal of Mechatronics and Applied Mechanics | 2019年 / 2019卷 / 05期

关键词：

Program debugging - XML - Automatic testing - Digital instruments;

D O I：

暂无

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

In order to optimize the traditional semiconductor test system, the high-speed mixed signal automatic test technology and test method based on virtual instrument were studied. Key technologies in high-speed mixed-signal test control were improved. A high-speed mixed-signal test system based on virtual instruments was designed. An automated test system for virtual instrument systems based on National Instruments was debugged and researched. This system consists of multi-channel PMU, high-speed LVD S/O, power supply, SMU and other modular instruments. Combined with a self-designed high-performance signal routing and chassis, and equipped with the necessary external instrumentation and OUT LoardBoard board, the fully functional mixed signal automatic test system was composed. The results showed that the test system was programmed with LabVIEW and TestStand, and the interface was simple, functional, friendly and versatile. Therefore, the system completed the 14-bit 2GSPS D/A converter test development, and the indicators met the requirements. © 2019, Cefin Publishing House. All rights reserved.

引用

页码：227 / 235

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