Fault detection capabilities of combinatorial testing and random testing for Boolean-specifications

被引:0
|
作者
Wang Z. [1 ,2 ,3 ]
Li Y. [1 ]
Gu X. [1 ]
Zheng X. [1 ]
Yu M. [1 ]
机构
[1] School of Computer Science and Technology, Nanjing University of Posts and Telecommunications, Nanjing
[2] Software Testing Engineering Laboratory of Jiangsu Province, Nanjing
[3] Tongda College, Nanjing University of Posts and Telecommunications, Yangzhou
关键词
Combinatorial testing; Fault detection frequency; Fault detection probability; Fault detection ratio; Random testing;
D O I
10.23940/ijpe.19.11.p14.29522961
中图分类号
学科分类号
摘要
The problem of fault detection capability of combinatorial testing has drawn a lot of attention. People conducted many experiments on different subjects to compare fault detection capabilities of combinatorial testing and random testing. However, previous confusing results can hardly answer the question of whether combinatorial test suite detects more faults than random test suite. To answer this question more trustfully, we conducted an experiment on general-form Boolean-specifications. In our experiment, fault detection frequencies and fault detection ratios in combinatorial testing, where test suites are generated by some classic combinatorial test generation algorithms, are collected by the repeated running of combinatorial testing. Moreover, fault detection probabilities in random testing are obtained by theoretical analysis. By comparing fault detection frequencies, ratios, and probabilities, our experimental results suggest that combinatorial testing has a little advantage of fault detection capability over random testing. © 2019 Totem Publisher, Inc. All rights reserved.
引用
收藏
页码:2952 / 2961
页数:9
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