Artificial Intelligence and Educational Measurement: Opportunities and Threats

被引:1
|
作者
Ho, Andrew D. [1 ]
机构
[1] Harvard Grad Sch Educ, Educ, 455 Gutman Lib,6 Appian Way, Cambridge, MA 02138 USA
关键词
Artificial Intelligence; assessment; content analysis; differential item functioning; measurements; testing;
D O I
10.3102/10769986241248771
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
I review opportunities and threats that widely accessible Artificial Intelligence (AI)-powered services present for educational statistics and measurement. Algorithmic and computational advances continue to improve approaches to item generation, scale maintenance, test security, test scoring, and score reporting. Predictable misuses of AI for these purposes will result in biased scores, construct underrepresentation, and differential impact over time. Recent efforts to develop standards for AI use in testing like those of Burstein are promising. I argue that similar efforts to develop AI standards for educational measurement will benefit from increased attention to the context of test use and explicit commitment to ongoing monitoring of bias and scale drift over time.
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页数:8
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