Design and verification of on-chip debug circuit based on JTAG

被引：0
|
作者：
Chuang, Bai [1 ,2 ]
Hao, Lü [1 ]
Wei, Zhang [1 ]
Fan, Li [1 ]
机构：
[1] School of Physics and Electronic Science, Changsha University of Science and Technology, Changsha,410114, China
[2] Hunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering, Changsha,410114, China
来源：
Journal of China Universities of Posts and Telecommunications | 2021年 / 28卷 / 03期
关键词：
D O I：
10.19682/j.cnki.1005-8885.2021.0019
中图分类号：
学科分类号：
摘要：
Digital signal processors
引用
收藏
页码：95 / 101
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