GaN 8Gbps high-speed relay MMIC for automated test equipment

被引：0
|
作者：
GaN を用いた半導体試験装置向け 8 Gbps 高速リレー MMIC
机构：
[1] Koyama, Satoshi
[2] Sato, Taku
[3] Okayasu, Jun'ichi
[4] Okabe, Hideyuki
[5] Kimishima, Masayuki
来源：
Koyama, Satoshi (satoshi.koyama@advantest.com) | 1600年 / Institute of Electrical Engineers of Japan卷 / 141期
关键词：
Equipment testing - Tantalum compounds - Gallium nitride - MIS devices - Wide band gap semiconductors - Metal insulator boundaries - Monolithic microwave integrated circuits;
D O I：
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摘要：
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页码：856 / 859
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