Surface Effect of Thickness-Dependent Polarization and Domain Evolution in BiFeO3 Epitaxial Ultrathin Films

被引:0
|
作者
Ren, Jing [1 ,2 ]
Tang, Shiyu [1 ,2 ]
Guo, Changqing [1 ,2 ]
Wang, Jing [1 ,2 ]
Huang, Houbing [1 ,2 ]
机构
[1] School of Materials Science and Engineering, Beijing Institute of Technology, Beijing,100081, China
[2] Advanced Research Institute of Multidisciplinary Science, Beijing Institute of Technology, Beijing,100081, China
来源
ACS Applied Materials and Interfaces | 2024年 / 16卷 / 01期
基金
中国国家自然科学基金;
关键词
Bismuth compounds - Ferroelectric thin films - Ferroelectricity - Film thickness - Iron compounds - Miniature instruments - Ultrathin films;
D O I
暂无
中图分类号
O441.1 [电学]; TM12 [];
学科分类号
摘要
With the trend of device miniaturization, ultrathin ferroelectric films are gaining more and more attention. However, understanding ferroelectricity in this nanoscale context remains a formidable challenge, primarily due to the heightened relevance of surface effects, which often leads to the loss of net polarization. Here, the influence of surface effects on the polarization as a function of thickness in ultrathin BiFeO3 films is investigated using phase-field simulations. The findings reveal a notable increase in ferroelectric polarization with increasing thickness, with a particularly discernible change occurring below the 10 nm threshold. Upon accounting for surface effects, the polarization is marginally lower than the case without such considerations, with the disparity becoming more pronounced at smaller thicknesses. Moreover, the hysteresis loop and butterfly loop of the ultrathin film were simulated, demonstrating that the ferroelectric properties of films remain robust even down to a thickness of 5 nm. Our investigations provide valuable insights into the significance of ferroelectric thin films in device miniaturization. © 2023 American Chemical Society.
引用
收藏
页码:1074 / 1081
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