Deep Learning-Assisted OFDM Detection with Hardware Impairments

被引：0
|
作者：
Singh, Amit [1 ]
Sharma, Sanjeev [1 ]
Deka, Kuntal [2 ]
Bhatia, Vimal [3 ]
机构：
[1] Indian Institute of Technology (IIT) BHU Varanasi, Varanasi,221005, India
[2] Indian Institute of Technology (IIT) Guwahati, Guwahati,781039, India
[3] Indian Institute of Technology (IIT) Indore, Indore,452020, India
来源：
Journal of Communications and Information Networks | 2023年 / 8卷 / 04期
关键词：
D O I：
10.23919/JCIN.2023.10272364
中图分类号：
学科分类号：
摘要：
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页码：378 / 388
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