MMC Multiple IGBT Open-circuit Fault Diagnosis Method Based on Capacitor Current State Estimation

被引：0
|
作者：
Yang, Xingwu [1 ]
Wang, Jiang [1 ]
Meng, Zhicheng [1 ]
Wang, Yani [1 ]
Bao, Wei [2 ]
Fu, Yang [1 ]
Huang, Hua [2 ]
机构：
[1] College of Electrical Engineering, Shanghai University of Electric Power, Yangpu District, Shanghai,200090, China
[2] East China Electric Power Test and Research Institute, Hongkou District, Shanghai,200437, China
来源：
Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering | 2023年 / 43卷 / 23期
关键词：
D O I：
10.13334/j.0258-8013.pcsee.221738
中图分类号：
学科分类号：
摘要：
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页码：9297 / 9309
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