Monolayer calibration of endofullerenes with x-ray absorption from implanted keV ion doses

被引:0
|
作者
Lee, Wei Chuang [1 ]
Yu, Lebin [1 ]
Oscarsson, Johan [2 ]
Ochapski, Michal W. [3 ]
Sagehashi, Ryunosuke [1 ]
Zhang, Yang [4 ]
Popov, Alexey A. [4 ]
Gebeyehu, Zewdu M. [3 ]
Martini, Leonardo [3 ]
Forti, Stiven [3 ]
Coletti, Camilla [3 ]
Delley, Bernard [5 ]
Muntwiler, Matthias [5 ]
Primetzhofer, Daniel [2 ]
Greber, Thomas [1 ]
机构
[1] Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland
[2] Uppsala Univ, Dept Phys & Astron, SE-75120 Uppsala, Sweden
[3] Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy
[4] Leibniz Inst Solid State & Mat Res IFW, D-01069 Dresden, Germany
[5] Paul Scherrer Inst PSI, Swiss Light Source, CH-5232 Villigen, Switzerland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2024年 / 42卷 / 02期
基金
瑞士国家科学基金会; 瑞典研究理事会;
关键词
THICKNESS;
D O I
10.1116/6.0003302
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray absorption spectroscopy (XAS) has the highest sensitivity for chemical element detection on surfaces. With this approach, small amounts of lanthanide-containing endofullerene molecules (Ho3N@C-80) have been measured by total electron yield at a low flux bending magnet beamline. The monolayer coverage is calibrated by extrapolating the signals of constant doses (3 x 10(14) cm(-2)) of Ho ions implanted into SiO2 with energies between 2 and 115 keV. At room temperature, the Ho XAS spectra of the molecules and implanted ions indicate trivalent but not identical Ho ground states. Still, this approach demonstrates a way for calibration of small coverages of molecules containing open core-shell elements. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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页数:5
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