A friction force microscope employing laser beam deflectionfor force detection

被引：0
|
作者：
路新春
温诗铸
孟永钢
黄平
戴长春
黄桂珍
王培森
白春礼
机构：
[1] Institute of Chemistry
[2] Tsinghua University
[3] State Key Tribology Laboratory
[4] Beijing 100080
[5] Chinese Academy of Sciences
[6] Beijing 100084
[7] China
来源：
ChineseScienceBulletin | 1996年 / 22期
基金：
中国国家自然科学基金;
关键词：
friction force microscope; nanotribology;
D O I：
暂无
中图分类号：
O439 [应用光学];
学科分类号：
070207 ; 0803 ;
摘要：
Nanotribology is now one of the most active research areas of tribology.Frictionforce microscopy(FFM),based on atomic force microscopy(AFM),is a method forstudying the feature of micro-friction of material surface with high resolution.So theFFM has received more attention and has been widely used in the area of nanotribology sinceit was developed.The latest results in the area of nanotribology are mostly obtained byusing AFM or FFM,which are the relationship between micro-scale friction force andslope of surface roughness,cyclicity of friction force on atomic scale,features ofmicro-wear,etc.However,there are many problems on how to employ AFM and
引用
收藏
页码：1873 / 1876
页数：4
相关论文
共 50 条
  • [31] Friction force measurements relevant to de-inking by means of atomic force microscope
    Theander, K
    Pugh, RJ
    Rutland, MW
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2005, 291 (02) : 361 - 368
  • [32] DYNAMICAL FRICTION COEFFICIENT MAPS USING A SCANNING FORCE AND FRICTION MICROSCOPE
    LABARDI, M
    ALLEGRINI, M
    SALERNO, M
    FREDIANI, C
    ASCOLI, C
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (01): : 3 - 10
  • [33] LATERAL FORCE MODULATION ATOMIC-FORCE MICROSCOPE FOR SELECTIVE IMAGING OF FRICTION FORCES
    YAMANAKA, K
    TOMITA, E
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (5B): : 2879 - 2882
  • [34] Calibration of atomic force microscope for nanoscale friction measurements
    Masalska, Agata
    Kolanek, Krzysztof
    Woszczyna, Miroslaw
    Zawierucha, Pawel
    Ritz, Yvonne
    Zschech, Ehrenfried
    2007 INTERNATIONAL STUDENTS AND YOUNG SCIENTISTS WORKSHOP PHOTONICS AND MICROSYSTEMS, PROCEEDINGS, 2007, : 50 - +
  • [35] Dynamic surface force measurement. 2. Friction and the atomic force microscope
    Attard, P
    Carambassis, A
    Rutland, MW
    LANGMUIR, 1999, 15 (02) : 553 - 563
  • [36] A novel frictional force microscope with 3-dimensional force detection
    Dienwiebel, M
    Heimberg, JA
    Zijlstra, T
    van der Drift, E
    Spaanderman, DJ
    de Kuyper, E
    Frenken, JWM
    NANOTRIBOLOGY: CRITICAL ASSESSMENT AND RESEARCH NEEDS, 2003, : 115 - 122
  • [37] OPTICAL BEAM-DEFLECTION SCANNING FORCE MICROSCOPE WITH EASY CANTILEVER-LASER BEAM ALIGNMENT
    SUGIHARA, K
    SAKAI, A
    MATSUDA, T
    TOYOSAKI, M
    TANAKA, K
    MATSUURA, A
    TSUKADA, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (02): : 620 - 621
  • [38] DETECTION OF LOCAL CONDUCTIVITY BY LASER-FREQUENCY MIXING IN A SCANNING FORCE MICROSCOPE
    VOLCKER, M
    KRIEGER, W
    WALTHER, H
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (09) : 5426 - 5431
  • [39] Detection of local conductivity by laser-frequency mixing in a scanning force microscope
    1600, (74):
  • [40] Detection of local conductivity by laser-frequency mixing in a scanning force microscope
    Volcker, M.
    Krieger, W.
    Walther, H.
    1600, American Inst of Physics, Woodbury, NY, USA (74):
12345