Accurate capacitance–voltage characterization of organic thin films with current injection

被引:0
|
作者
褚明 [1 ]
刘少博 [1 ]
蔚安然 [2 ]
于浩淼 [3 ]
秦佳俊 [4 ]
衣睿宸 [1 ]
裴远 [1 ]
朱春琴 [1 ]
朱光瑞 [1 ]
曾琪 [5 ]
侯晓远 [1 ]
机构
[1] State Key Laboratory of Surface Physics, Fudan University
[2] State Key Laboratory of ASIC and System, Center of Micro-Nano System, SIST, Fudan University
[3] Key Laboratory of Luminescence and Optical Information, Ministry of Education, School of Science, Beijing Jiaotong University
[4] Department of Physics, Chemistry and Biology (IFM), Link?ping University
[5] School of Material Engineering, Shanghai University of Engineering Science
基金
中国国家自然科学基金;
关键词
current injection; organic thin film; capacitance–voltage; parasitic resistance;
D O I
暂无
中图分类号
O482.4 [电学性质];
学科分类号
070205 ; 0805 ; 080502 ; 0809 ;
摘要
To deal with the invalidation of commonly employed series model and parallel model in capacitance–voltage(C–V) characterization of organic thin films when current injection is significant, a three-element equivalent circuit model is proposed. On this basis, the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method. The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor, a diode, and a resistor. Moreover, the accurate C–V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result, and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode. This work strongly demonstrates the necessity to consider current injection in C–V measurement and provides a strategy for accurate C–V characterization experimentally.
引用
收藏
页码:539 / 545
页数:7
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