Junction-temperature estimation in AlGaInP light-emitting diodes using the luminescence spectra method

被引:0
|
作者
文静
文玉梅
李平
王三山
机构
[1] ResearchCenterofSensorsandInstruments,CollegeofOptoelectronicEngineering,ChongqingUniversity
关键词
D O I
暂无
中图分类号
学科分类号
摘要
This study proposes a practical method to estimate the junction temperature of AlGaInP LEDs using the luminescence spectra method.The peak wavelength shift of LEDs is due to the energy band gap shrinking.The temperature dependence of the bandgap of AlGalnP LEDs is derived from those of the underlying binary compounds A1 P,GaP,and InP.Based on this,a theoretical model for the dependence of the peak wavelength on junction temperature is developed.Experimental results on the junction temperature of AlGalnP red light-emitting diodes are presented.Excellent agreement between the theoretical and experimental temperature dependence of the peak wavelength is found.
引用
收藏
页码:101 / 104
页数:4
相关论文
共 50 条
  • [31] Junction temperature in light-emitting diodes assessed by different methods
    Chhajed, S
    Xi, Y
    Gessmann, T
    Xi, JQ
    Shah, JM
    Kim, JK
    Schubert, EF
    LIGHT-EMITTING DIODES: RESEARCH, MANUFACTURING, AND APPLICATIONS IX, 2005, 5739 : 16 - 24
  • [32] Estimation of Internal Junction Temperature & Thermal Resistance of Light-Emitting Diodes Using External Luminous Flux Measurements
    Tao, X. H.
    Li, S. N.
    Hui, S. Y. R.
    2010 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION, 2010, : 179 - 183
  • [33] A Continuous Rectangular-Wave Method for Junction Temperature Measurement of Light-Emitting Diodes
    Liu, Ze-Hui
    Huang, Jia-En
    Gao, Yu-Lin
    Guo, Zi-Quan
    Lin, Yue
    Zhu, Li-Hong
    Chen, Zhong
    Lu, Yi-Jun
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (11) : 10414 - 10424
  • [34] High-brightness AlGaInP light-emitting diodes using surface texturing
    Linder, N
    Kugler, S
    Stauss, P
    Streubel, KP
    Wirth, R
    Zull, H
    LIGHT-EMITTING DIODES: RESEARCH MANUFACTURING, AND APPLICATIONS V, 2001, 4278 : 19 - 25
  • [35] Temperature dependences of photoluminescence and electroluminescence spectra in light-emitting diodes
    Li, Lian
    Li, Ping
    Wen, Yumei
    Wen, Jing
    Zhu, Yong
    APPLIED PHYSICS LETTERS, 2009, 94 (26)
  • [36] AlGaInP-sapphire glue bonded light-emitting diodes
    Chang, SJ
    Su, YK
    Yang, T
    Chang, CS
    Chen, TP
    Huang, KH
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 2002, 38 (10) : 1390 - 1394
  • [37] An Improvement on the Junction Temperature Measurement of Light-Emitting Diodes by using the Peak Shift Method Compared with the Forward Voltage Method
    He Su-Ming
    Luo Xiang-Dong
    Zhang Bo
    Fu Lei
    Cheng Li-Wen
    Wang Jin-Bin
    Lu Wei
    CHINESE PHYSICS LETTERS, 2012, 29 (12)
  • [38] Manufacture of AlGaInP visible light-emitting diodes by MOCVD & VPE
    Zeng, QK
    Zeng, XF
    Liao, CJ
    Liu, SH
    SOLID-STATE ELECTRONICS, 1998, 42 (06) : 993 - 995
  • [39] Electron Irradiation Degradation of AlGaInP/GaAs Light-Emitting Diodes
    Brudnyi, Valentin
    Prudaev, Ilya
    Oleinik, Vladimir
    Marmaluk, Alexander
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (08):
  • [40] Determining Junction Temperature in InGaN Light-Emitting Diodes Using Low Forward Currents
    Lin, Siqi
    Shih, Tienmo
    Lu, Yijun
    Gao, Yulin
    Zhu, Lihong
    Chen, Guolong
    Wu, Biqing
    Guo, Ziquan
    Zhang, Jihong
    Fan, Xianguang
    Chang, Richard Rugin
    Chen, Zhong
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (11) : 3775 - 3779