Interface roughness scattering in an AlGaAs/GaAs triangle quantum well and square quantum well

被引:0
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作者
金晓 [1 ]
张红 [1 ]
周荣秀 [1 ]
金钊 [2 ]
机构
[1] College of Mechanical Engineering,Yantai Nanshan University
[2] School of Foreign Languages,Beijing Forestry
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O471.1 [半导体量子理论];
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摘要
<正>We have theoretically studied the mobility limited by interface roughness scattering on two-dimensional electrons gas(2DEG) at a single heterointerface(triangle-shaped quantum well).Our results indicate that,like the interface roughness scattering in a square quantum well,the roughness scattering at the AlxGa1-xAs/GaAs heterointerface can be characterized by parameters of roughness height A and lateral A,and in addition by electric field F.A comparison of two mobilities limited by the interface roughness scattering between the present result and a square well in the same condition is given.
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页码:15 / 18
页数:4
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