ION OPTICS OF A TIME-OF-FLIGHT MASS-SPECTROMETER WITH ELECTROSTATIC SECTOR ANALYZERS

The ion optics for a high resolution time-of-flight mass spectrometer with electrostatic sector analyzers have been investigated. The multiple focusing (triple isochronous focusing and triple spacial focusing) conditions can be achieved by using a symmetrical arrangement of the sectors in a mass spectrometer. Both high mass resolution and high ion transmission can be accomplished simultaneously. The principles of MS/MS and MS/MS/MS analyses using a TOF mass spectrometer with electrostatic sector analyzers have been proposed. Product ion spectra can be obtained by measuring the total night times and the kinetic energy of the products without any additional separation processes, any coincidence techniques or any special timing circuits. In an experiment, MS/MS and MS/MS/MS mass spectra have been obtained. The first generation product ions have been produced by a metastable decay, and the second generation products have been produced by a sequential decay.