共 50 条
- [1] GEOMETRICAL CORRECTION FACTOR FOR RESISTIVITY OF SEMICONDUCTORS BY THE SQUARE 4-POINT PROBE METHOD JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (04): : 563 - 567
- [3] AN AC BRIDGE FOR SEMICONDUCTOR RESISTIVITY MEASUREMENTS USING A 4-POINT PROBE BELL SYSTEM TECHNICAL JOURNAL, 1961, 40 (03): : 885 - +