ELECTROMIGRATION IN THIN SILVER, COPPER, GOLD, INDIUM, TIN, LEAD AND MAGNESIUM FILMS

被引：57
|
作者：
BREITLING, HM
HUMMEL, RE
机构：
来源：
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1972年 / 33卷 / 04期
关键词：
D O I：
10.1016/S0022-3697(72)80101-X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：845 / +
页数：1
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