ELECTROMIGRATION IN THIN SILVER, COPPER, GOLD, INDIUM, TIN, LEAD AND MAGNESIUM FILMS

被引：56

|

作者：

BREITLING, HM

HUMMEL, RE

机构：

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1972年 / 33卷 / 04期

关键词：

D O I：

10.1016/S0022-3697(72)80101-X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：845 / +

页数：1

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