LOW-POWER TOPS THE CICC AGENDA FOR ANALOG AND MIXED-SIGNAL ICS

被引：0
|
作者：
GOODENOUGH, F
机构：
来源：
ELECTRONIC DESIGN | 1994年 / 42卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：46 / &
相关论文
共 50 条
  • [21] Mixed-signal IC developments highlighted at the CICC
    Goodenough, F
    ELECTRONIC DESIGN, 1996, 44 (09) : 102 - &
  • [22] Managing power consumption in analog and mixed-signal circuits
    Margolin, B
    COMPUTER DESIGN, 1997, 36 (01): : 36 - &
  • [23] Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs
    Pavlidis, Antonios
    Faehn, Eric
    Louerat, Marie-Minerve
    Stratigopoulos, Haralampos-G
    2022 IEEE 40TH VLSI TEST SYMPOSIUM (VTS), 2022,
  • [24] Power Profiling of Embedded Analog/Mixed-Signal Systems
    Haase, Jan
    Grimm, Christoph
    INTEGRATED CIRCUIT AND SYSTEM DESIGN: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION, 2011, 6448 : 250 - 250
  • [25] A low-power mixed-signal baseband system design for wireless sensor networks
    Li, Y
    De Bernardinis, F
    Otis, B
    Rabaey, JM
    Vincentelli, AS
    CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2005, : 55 - 58
  • [26] Development of Low-Power Analog/RF Mixed-Signal Circuits with Flexible Thin Film Devices for Wireless BMI Systems
    Akita, Ippei
    2015 IEEE INTERNATIONAL SYMPOSIUM ON RADIO-FREQUENCY INTEGRATION TECHNOLOGY (RFIT), 2015, : 4 - 6
  • [27] TESTING CHALLENGES FOR MIXED-SIGNAL ICS
    JACOB, G
    EE-EVALUATION ENGINEERING, 1994, 33 (05): : 154 - 155
  • [28] Soft defect Localization on Analog and Mixed-signal ICs Using an OBIRCH Tool
    Wu, Chunlei
    Li, Xiaocui
    Che, Yi
    ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2015, : 31 - 34
  • [29] Analog, mixed-signal ICs steering drive-by-wire toward reality
    Margolin, B
    COMPUTER DESIGN, 1997, 36 (12): : 31 - +
  • [30] Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs
    Pavlidis, Antonios
    Faehn, Eric
    Louerat, Marie-Minerve
    Stratigopoulos, Haralampos-G.
    Proceedings of the IEEE VLSI Test Symposium, 2022, 2022-April
12345