AN ELECTRON-DIFFRACTION STUDY OF THIN FILMS IN BI-O SYSTEM

被引：0

|

作者：

ZAVYALOVA, AA

IMAMOV, RM

PINSKER, ZG

机构：

来源：

SOVIET PHYSICS CRYSTALLOGRAPHY, USSR | 1965年 / 9卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

收藏

页码：724 / +

页数：1

相关论文

共 50 条

[41] ELECTRON-DIFFRACTION STUDY OF SAME PHASES IN THIN LAYERS OF SYSTEMS TA-O
KHITROVA, VI
KLECKOVS.VV
ACTA CRYSTALLOGRAPHICA, 1966, S 21 : A59 - &
[42] DIRECT DETERMINATION OF THE INTEGRAL EMISSIVITY OF THIN-FILMS BY ELECTRON-DIFFRACTION
PUGACHEV, AT
BRATSYKHIN, VM
VOLKOV, YA
RUSSIAN METALLURGY, 1980, (01): : 167 - 169
[43] SOME OBSERVATIONS ON THIN BETA-TIN FILMS BY ELECTRON-DIFFRACTION
GAUTHIER, JP
MICHEL, P
THIN SOLID FILMS, 1972, 14 (01) : 187 - 192
[44] ELECTRON-DIFFRACTION STUDY OF THIN-FILMS OF BINARY-MIXTURES OF RARE-GASES
KOVALENKO, SI
KHUDOTEPLAYA, AA
INDAN, EI
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 13 (01): : 235 - +
[45] ELECTRON-DIFFRACTION STUDY ON KINETICS OF PHASE TRANSFORMATIONS IN TISE AND CU-S THIN FILMS
EFENDIEV, GA
ALIEV, FI
KAZINEC, MN
SAFIZADE, RB
IVANOVA, IV
NURIEV, IP
ACTA CRYSTALLOGRAPHICA, 1966, S 21 : A194 - &
[46] ELECTRON-DIFFRACTION ON SPUTTERED TANTALUM FILMS
BURKARD, H
HUGI, W
HELVETICA PHYSICA ACTA, 1979, 52 (01): : 79 - 79
[47] SCANNING ELECTRON-DIFFRACTION SYSTEM
GRIGSON, CWB
NIXON, WC
JOURNAL OF APPLIED PHYSICS, 1966, 37 (10) : 3935 - &
[48] ELECTRON-DIFFRACTION STUDY OF LOW-LOSS DIELECTRIC FILMS
DUBEY, GC
THIN SOLID FILMS, 1974, 24 (02) : 261 - 264
[49] ELECTRON-DIFFRACTION STUDY OF TES FILMS OBTAINED BY VACUUM DEPOSITION
ALIYEV, FI
ISMAILOV, DI
SHAFIZADE, RB
KRISTALLOGRAFIYA, 1985, 30 (04): : 829 - +
[50] ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS
GEORGE, CF
DANTONIO, P
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) : 323 - 334

← 1 2 3 4 5 →