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- [21] CHARACTERIZATION OF FERROCHROMIUM THIN-FILMSJOURNAL OF MATERIALS SCIENCE LETTERS, 1989, 8 (01) : 80 - 82KUMARI, SVVAIDYAN, VKKOSHY, P
- [22] INVERSE PROBLEM OF THE PHENOMENOLOGICAL THEORY OF THE OPTICAL-PROPERTIES OF THIN-FILMSTHIN SOLID FILMS, 1978, 55 (02) : 201 - 209BONDAR, EAKULYUPIN, YAPOPOVICH, NN
- [23] CHARACTERIZATION OF MATERIALS, THIN-FILMS, AND INTERFACES BY OPTICAL REFLECTANCE AND ELLIPSOMETRIC TECHNIQUESACS SYMPOSIUM SERIES, 1986, 295 : 192 - 207ASPNES, DE
- [24] GROWTH AND CHARACTERIZATION OF EPITAXIAL GARNET THIN-FILMS FOR OPTICAL READOUT APPLICATIONSJOURNAL OF CHEMICAL RESEARCH-S, 1987, (05): : 144 - 145DESVIGNES, JMCHEVRIER, FBENYOUSSEF, JLEHUREAU, JCCASTERA, JP
- [25] PHOTOTHERMAL CHARACTERIZATION OF SOLIDS AND THIN-FILMS BY OPTICAL AND SCANNING PROBE TECHNIQUESMICROELECTRONIC ENGINEERING, 1994, 24 (1-4) : 107 - 112OESTERSCHULZE, ESTOPKA, MKASSING, R
- [26] NONCONTACT OPTICAL CHARACTERIZATION OF THIN-FILMS - MECHANICAL AND THERMAL-PROPERTIESABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 205 : 65 - PHYSROGERS, JANELSON, KA
- [27] 2-STEP REGRESSION PROCEDURE FOR THE OPTICAL CHARACTERIZATION OF THIN-FILMSAPPLIED OPTICS, 1991, 30 (07): : 839 - 846BABU, SVDAVID, MPATEL, RC
- [28] CHARACTERIZATION OF MATERIALS, THIN-FILMS, AND INTERFACES BY OPTICAL REFLECTANCE AND ELLIPSOMETRIC SPECTROSCOPIESABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 187 (APR): : 74 - INDEASPNES, DE
- [29] OPTICAL METHODS FOR THE CHARACTERIZATION OF THIN-FILMS - AN INTRODUCTION FROM AN INDUSTRIAL VIEWPOINTACTA ELECTRONICA, 1981, 24 (02): : 125 - 131MEYER, F
- [30] OPTICAL AND ELECTRICAL CHARACTERIZATION OF LEAD-TELLURIDE CRYSTALLINE THIN-FILMSJOURNAL DE PHYSIQUE, 1972, 33 (01): : 119 - +PICCIOLI, NBESSON, JMBALKANSKI, M