OPTICAL CHARACTERIZATION OF THIN-FILMS - THEORY

被引：31

|

作者：

HANSEN, WN ^{[1
]}

机构：

[1] UTAH STATE UNIV,LOGAN,UT 84322

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1973年 / 63卷 / 07期

关键词：

D O I：

10.1364/JOSA.63.000793

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：793 / 802

页数：10

相关论文

共 50 条

[1] CHARACTERIZATION OF OPTICAL THIN-FILMS
PULKER, HK
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (10) : 1417 - 1418
[2] CHARACTERIZATION OF OPTICAL THIN-FILMS
PULKER, HK
APPLIED OPTICS, 1979, 18 (12): : 1969 - 1977
[3] OPTICAL CHARACTERIZATION OF THIN-FILMS
ANDERSON, WJ
HANSEN, WN
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (08) : 1051 - 1058
[4] PHOTOTHERMAL CHARACTERIZATION OF OPTICAL THIN-FILMS
WU, ZL
KUO, PK
WEI, LH
GU, SL
THOMAS, RL
THIN SOLID FILMS, 1993, 236 (1-2) : 191 - 198
[5] CHARACTERIZATION OF OPTICAL THIN-FILMS AND SURFACES
BENNETT, HE
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1426 - 1426
[6] CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY
TROLIERMCKINSTRY, S
CHINDAUDOM, P
VEDAM, K
HIREMATH, BV
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1995, 78 (09) : 2412 - 2416
[7] OPTICAL CHARACTERIZATION OF TUNGSTEN SILICIDE THIN-FILMS
DELFINO, M
LEHRER, WI
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (05) : 1071 - 1074
[8] FABRICATION AND CHARACTERIZATION OF INHOMOGENEOUS OPTICAL THIN-FILMS
BERTRAM, RW
LANG, RV
OUELLETTE, MF
YAN, KL
THIN SOLID FILMS, 1989, 181 : 589 - 595
[9] OPTICAL CHARACTERIZATION OF THIN-FILMS BY GUIDED-WAVES
PELLETIER, E
FLORY, F
HU, Y
APPLIED OPTICS, 1989, 28 (14) : 2918 - 2924
[10] SELECTED CHARACTERIZATION TECHNIQUES FOR OPTICAL THIN-FILMS AND SURFACES
BENNETT, HE
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 387 : 131 - 137

← 1 2 3 4 5 →