MEASUREMENT OF REAL SURFACE AREA OF SEMICONDUCTORS

被引：0
|
作者：
NAKHMANSON, RS
GOLIKOV, YA
机构：
来源：
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1968年 / 1卷 / 07期
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D O I：
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
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页码：924 / +
页数：1
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