MEASUREMENT OF REAL SURFACE AREA OF SEMICONDUCTORS

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作者：

NAKHMANSON, RS

GOLIKOV, YA

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来源：

SOVIET PHYSICS SEMICONDUCTORS-USSR | 1968年 / 1卷 / 07期

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中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

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页码：924 / +

页数：1

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