PHYSICAL-PROPERTIES OF AU-ZNSE METAL-SEMICONDUCTOR CONTACT

被引：23
|
作者：
MACH, R [1 ]
TREPTOW, H [1 ]
LUDWIG, W [1 ]
机构：
[1] DAWB,ZENT INST ELEKTR PHYS,BERLIN,EAST GERMANY
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 25卷 / 02期
关键词：
D O I：
10.1002/pssa.2210250224
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：567 / 573
页数：7
相关论文
共 50 条
  • [41] Effect of metal contact size on the metal-semiconductor junction characteristics
    Patole, Shashikant P.
    Ali, Ahmed
    Alkindi, Fatmah
    Rezeq, Moh'd
    2018 IEEE 18TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2018,
  • [42] THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES
    Brillson, L. J.
    SURFACE SCIENCE REPORTS, 1982, 2 (02) : 123 - 326
  • [43] EXPITAXIAL METAL-SEMICONDUCTOR STRUCTURES AND THEIR PROPERTIES
    TUNG, RT
    LEVI, AFJ
    GIBSON, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (06): : 1435 - 1443
  • [44] Effect of a change in the intermediate layer accompanying deposition of metal on the electrophysical properties of a metal-semiconductor contact
    1600, (31):
  • [45] Electrical properties of metal-semiconductor nanocontacts
    Vostokov, NV
    Shashkin, VI
    SEMICONDUCTORS, 2004, 38 (09) : 1047 - 1052
  • [46] Photocatalytic Properties of Metal-Semiconductor Nanosystems
    Bulavinets, Tetiana
    Yaremchuk, Iryna
    Barylyak, Adriana
    Bobitski, Yaroslav
    2020 IEEE 40TH INTERNATIONAL CONFERENCE ON ELECTRONICS AND NANOTECHNOLOGY (ELNANO), 2020, : 442 - 445
  • [47] Optical properties of metal-semiconductor composites
    Bates Jr., C.W.
    Key Engineering Materials, 1995, 108-110 : 355 - 380
  • [48] Electrical properties of metal-semiconductor nanocontacts
    N. V. Vostokov
    V. I. Shashkin
    Semiconductors, 2004, 38 : 1047 - 1052
  • [49] DEPENDENCE OF BARRIER HEIGHT OF METAL-SEMICONDUCTOR CONTACT (AU-GAAS) ON THICKNESS OF SEMICONDUCTOR SURFACE-LAYER - COMMENT
    WEI, CH
    YEE, SS
    JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) : 971 - 971
  • [50] Metal-semiconductor contact in organic thin film transistors
    Rhee, Shi-Woo
    Yun, Dong-Jin
    JOURNAL OF MATERIALS CHEMISTRY, 2008, 18 (45) : 5437 - 5444
12345