DETERMINING GRAVITATIONAL DEFORMATION OF AN OPTICAL FLAT BY LIQUID SURFACE INTERFEROMETRY

被引：7
|
作者：
DEBENHAM, M
DEW, GD
机构：
来源：
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 1980年 / 2卷 / 02期
关键词：
D O I：
10.1016/0141-6359(80)90066-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：93 / 97
页数：5
相关论文
共 50 条
  • [21] CONFORMAL-FLAT GRAVITATIONAL-FIELDS OF AN IDEAL LIQUID
    IVANOV, GG
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1980, (12): : 22 - 25
  • [22] Optical interferometry as a solution to detect liquid adulteration
    Alvarez-Tamayo, R., I
    Prieto-Cortes, P.
    Barcelata-Pinzon, A.
    INTERFEROMETRY AND STRUCTURED LIGHT 2024, 2024, 13135
  • [23] Evaluation of earthquake potential and surface deformation by Differential Interferometry
    Yen, Jiun-Yee
    Chen, Kun-Shan
    Chang, Chung-Pai
    Boemer, Wolfgang-Martin
    REMOTE SENSING OF ENVIRONMENT, 2008, 112 (03) : 782 - 795
  • [24] Land-surface deformation corresponding to seasonal ground-water fluctuation, determining by SAR interferometry in the SW Taiwan
    Chang, CP
    Chang, TY
    Wang, CT
    Kuo, CH
    Chen, KS
    MATHEMATICS AND COMPUTERS IN SIMULATION, 2004, 67 (4-5) : 351 - 359
  • [25] Determining topological charge of an optical beam using a wedged optical flat
    Khajavi, Behzad
    Galvez, Enrique J.
    OPTICS LETTERS, 2017, 42 (08) : 1516 - 1519
  • [26] Nanoscale Deformation of a Liquid Surface
    Ledesma-Alonso, Rene
    Legendre, Dominique
    Tordjeman, Philippe
    PHYSICAL REVIEW LETTERS, 2012, 108 (10)
  • [27] Determining the wedge angle and optical homogeneity of a glass plate by statistically analyzing the deformation in the wavefront surface
    Yang, Pao-Keng
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2017, 88 (08):
  • [28] Evaluation of the deformation value of an optical flat under gravity
    Kondo, Yohan
    Bitou, Youichi
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2014, 25 (06)
  • [29] Optical interferometry microscope for surface topography measurement
    Nishikawa T.
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 2010, 76 (09): : 999 - 1002
  • [30] Optical interferometry for surface measurements of CMP pads
    Stein, D
    Hetherington, D
    Dugger, M
    Stout, T
    JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (10) : 1623 - 1627
12345