共 50 条
- [11] SURFACE-ROUGHNESS FORMATION IN SI DURING CS+ ION-BOMBARDMENT JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (05): : 2641 - 2645
- [13] Negative secondary ion mass spectra under Cs+ ion bombardment of the p-SiC-〈B〉-surface Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2011, 5 : 796 - 800
- [14] STUDY ON NEGATIVE SECONDARY ION EMISSION OF COPPER AND SOME OF ITS ALLOYS USING CS+ ION-BOMBARDMENT INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1977, 24 (03): : 241 - 254
- [15] SECONDARY ION YIELD CHANGES IN SI DUE TO TOPOGRAPHY CHANGES DURING CS+ ION-BOMBARDMENT JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1991, 30 (5B): : L927 - L929
- [17] A NEGATIVE-ION SOURCE FOR ALKALI IONS NUCLEAR INSTRUMENTS & METHODS, 1980, 175 (2-3): : 393 - 396
- [18] Negative secondary ion mass spectra under Cs+ ion bombardment of the p-SiC-aOE©B⟩-surface JOURNAL OF SURFACE INVESTIGATION, 2011, 5 (04): : 796 - 800
- [19] Roughening of silicon (1 0 0) surface during low energy Cs+ ion bombardment NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2011, 269 (09): : 905 - 908
- [20] UNIVERSAL POSITIVE OR NEGATIVE-ION SOURCE BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (02): : 148 - 149