CREEP OF POLYCRYSTALLINE SILICON CARBIDE

被引：50
|
作者：
FRANCIS, TL
COBLE, RL
机构：
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1968年 / 51卷 / 02期
关键词：
D O I：
10.1111/j.1151-2916.1968.tb11853.x
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：115 / &
相关论文
共 50 条
  • [21] Fracture toughness of polycrystalline silicon carbide thin films
    Bellante, JJ
    Kahn, H
    Ballarini, R
    Zorman, CA
    Mehregany, M
    Heuer, AH
    APPLIED PHYSICS LETTERS, 2005, 86 (07) : 1 - 3
  • [22] Mechanical behavior of polycrystalline silicon carbide at high temperatures
    Gallardo-Lopez, A.
    Munoz, A.
    Martinez-Fernandez, J.
    Dominguez-Rodriguez, A.
    Informacion Tecnologica, 1998, 9 (02): : 221 - 226
  • [23] Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide
    Zhang, D.
    Zhao, L. G.
    Roy, A.
    Chiu, Y. -L.
    JOURNAL OF THE AUSTRALIAN CERAMIC SOCIETY, 2020, 56 (03) : 951 - 967
  • [24] Development of Transparent Polycrystalline Beta-Silicon Carbide
    Bayya, Shyam S.
    Villalobos, Guillermo R.
    Hunt, Michael P.
    Sanghera, Jasbinder S.
    Sadowski, Bryan M.
    Aggarwal, Ishwar D.
    Cinibulk, Michael
    Carney, Carmen
    Keller, Kristin
    MATERIAL TECHNOLOGIES AND APPLICATIONS TO OPTICS, STRUCTURES, COMPONENTS, AND SUB-SYSTEMS, 2013, 8837
  • [25] Characterization of polycrystalline silicon carbide films grown by atmospheric pressure chemical vapor deposition on polycrystalline silicon
    Christian A. Zorman
    Shuvo Roy
    Chien-Hung Wu
    Aaron J. Fleischman
    Mehran Mehregany
    Journal of Materials Research, 1998, 13 : 406 - 412
  • [26] Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide
    D. Zhang
    L. G. Zhao
    A. Roy
    Y.-L. Chiu
    Journal of the Australian Ceramic Society, 2020, 56 : 951 - 967
  • [27] Oxidation of polycrystalline alpha-silicon carbide ceramic
    Liu, DM
    CERAMICS INTERNATIONAL, 1997, 23 (05) : 425 - 436
  • [28] Multiscale modeling of the thermal conductivity of polycrystalline silicon carbide
    Crocombette, Jean-Paul
    Gelebart, Lionel
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (08)
  • [29] Characterization of polycrystalline silicon carbide films grown by atmospheric pressure chemical vapor deposition on polycrystalline silicon
    Zorman, CA
    Roy, S
    Wu, CH
    Fleischman, AJ
    Mehregany, M
    JOURNAL OF MATERIALS RESEARCH, 1998, 13 (02) : 406 - 412
  • [30] CREEP IN SINTERED POLYCRYSTALLINE NIOBIUM CARBIDE AND NIOBIUM CARBIDE-BASED SOLID SOLUTIONS.
    Kats, S.M.
    Ordan'yan, S.S.
    Soviet powder metallurgy and metal ceramics, 1984, 23 (05): : 414 - 418
12345