HOLOGRAPHIC PHOTOELECTRO-CHEMICAL ETCHING OF SUBMICRON GRATINGS IN NORMAL-INP FOR DFB DBR LASERS

被引:0
|
作者
WU, J
LIU, RT
LIN, SM
机构
[1] Department of Applied Physics Faculty of Engineering, University of Tokyo, Tokyo, 113, 7-3-1 Hongo, Bunkyo-ku
[2] Department of Physics, Xiamen University, Xiamen, Fujian
[3] Department of Electronics Engineering, Xiamen University, Xiamen, Fujian
关键词
SEMICONDUCTOR; HOLOGRAPHIC INTERFERENCE; PHOTOELECTROCHEMISTRY;
D O I
10.1002/mop.4650040512
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Second-order diffraction gratings for 1.55-mu-m DFB/DBR lasers have been formed by holographic photoelectrochemical (PEC) etching directly on n-InP substrates with high uniformity and reproducibility. In particular, the dependence of PEC etching rate on the biasing voltage is investigated. The optimum biasing voltage is also given.
引用
收藏
页码:209 / 212
页数:4
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