A METHOD FOR DETERMINING OPTICAL CONSTANTS AND THICKNESS OF DIELECTRIC FILMS

被引：0

|

作者：

GISIN, MA

KONYUKHO.GP

NESMELOV, EA

机构：

来源：

OPTICS AND SPECTROSCOPY-USSR | 1969年 / 26卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：162 / &

相关论文

共 50 条

[31] USE OF EVAPORATED DIELECTRIC FILM FOR DETERMINING OPTICAL CONSTANTS OF METAL
BENNETT, JM
BENNETT, HE
ASHLEY, EJ
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (04) : 564 - &
[32] AUTOMATIC EVALUATION OF OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS - APPLICATION TO THIN DIELECTRIC LAYERS
PELLETIER, E
ROCHE, P
VIDAL, B
NOUVELLE REVUE D OPTIQUE, 1976, 7 (06): : 353 - 362
[33] SIMPLIFIED METHOD FOR DETERMINING PIEZOELECTRIC CONSTANTS FOR THICKNESS MODE TRANSDUCERS
FOX, MD
DONNELLY, JF
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1978, 64 (05): : 1261 - 1265
[34] Determining thickness and optical properties of a-SiOx thin films by PUMA and envelope method
Merkulova, I. E.
XXXVI SIBERIAN THERMOPHYSICAL SEMINAR (STS 36), 2020, 1677
[35] Determining thickness independently from optical constants by use of ultrafast light
Huang, F
Federici, JF
Gary, D
OPTICS LETTERS, 2004, 29 (20) : 2435 - 2437
[36] DEVICE FOR MEASUREMENT OF REFRACTIVE-INDEX AND THICKNESS OF TRANSPARENT DIELECTRIC FILMS BY THE OPTICAL METHOD
SMIRNOV, IK
POLYAKOV, YG
ORLOV, GN
OPTIKA I SPEKTROSKOPIYA, 1979, 47 (05): : 988 - 990
[37] A second undamped wave method of determining dielectric constants.
Carman, AP
Lorance, GT
PHYSICAL REVIEW, 1922, 20 (06): : 715 - 718
[38] ANALYSIS OF THE REFLECTION-TRANSMISSION METHOD FOR DETERMINING THE OPTICAL-CONSTANTS ON THIN-FILMS
TRUSZKOWSKA, K
OPTICA APPLICATA, 1980, 10 (02) : 139 - 144
[39] Determination of optical constants and thickness of diamond-like carbon films by a multiple sample method
Zhou Y.
Wang A.
Guangxue Xuebao/Acta Optica Sinica, 2010, 30 (08): : 2467 - 2472
[40] ELLIPSOMETRIC METHOD FOR MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF THIN ABSORBING FILMS ON METAL SUBSTRATES
SHKLYAREVSKII, IN
ELSHAZLI, AF
YAROVAYA, RG
KOSTYUK, VP
OPTIKA I SPEKTROSKOPIYA, 1974, 36 (01): : 199 - 204

← 1 2 3 4 5 →