INTERNAL-FRICTION MEASUREMENTS IN BORON-DOPED SINGLE-CRYSTAL SILICON

被引：4
|
作者：
LAM, CC
DOUGLASS, DH
机构：
来源：
PHYSICS LETTERS A | 1981年 / 85卷 / 01期
关键词：
D O I：
10.1016/0375-9601(81)90635-6
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：41 / 42
页数：2
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