STUDY OF SUBSTRUCTURE OF SILICON-IRON BY X-RAY TOPOGRAPHY METHOD

被引：0

作者：

CHERNIKO.NV

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FIZIKA METALLOV I METALLOVEDENIE | 1972年 / 34卷 / 03期

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TF [冶金工业];

学科分类号：

0806 ;

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引用

页码：655 / &

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[1] X-RAY STUDY OF TOPOGRAPHY OF CYCLICALLY DEFORMED SINGLE-CRYSTALS OF SILICON-IRON
MOISEEV, LM
KHANONKI.AA
FIZIKA METALLOV I METALLOVEDENIE, 1972, 34 (03): : 658 - &
[2] X-RAY TOPOGRAPHY METHOD OF ANALYZING SUBSTRUCTURE OF TRANSFORMER STEEL
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PHYSICS OF METALS AND METALLOGRAPHY, 1972, 34 (03): : 201 - 204
[3] X-RAY STUDY OF IRON MICROCRYSTAL SUBSTRUCTURE
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SIDOKHIN, EF
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[4] X-RAY TOPOGRAPHY OF FERROMAGNETIC DOMAINS OF SILICON IRON
MAKAROV, VP
MOLOTILO.BV
SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1970, 14 (06): : 945 - &
[5] X-RAY TOPOGRAPHY STUDY OF MICRODEFECTS IN SILICON
KRYLOVA, NO
MELING, V
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FIZIKA TVERDOGO TELA, 1986, 28 (02): : 440 - 446
[6] SIMULATION OF X-RAY TOPOGRAPHS OF FERROMAGNETIC DOMAINS IN SILICON-IRON, ESPECIALLY THEIR JUNCTIONS
NOURTIER, C
KLEMAN, M
TAUPIN, D
MILTAT, J
LABRUNE, M
EPELBOIN, Y
JOURNAL OF APPLIED PHYSICS, 1979, 50 (03) : 2143 - 2145
[7] AN X-RAY DIFFRACTION METHOD FOR THE STUDY OF SUBSTRUCTURE OF CRYSTALS
INTRATER, J
WEISSMANN, S
ACTA CRYSTALLOGRAPHICA, 1954, 7 (11): : 729 - &
[8] SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY OF SUBSTRUCTURE IN GRAIN ORIENTED-SILICON STEELS
OKAMOTO, M
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (13): : 1353 - 1353
[9] X-RAY-DIFFRACTION ANALYSIS OF MOLTEN SILICON-IRON
BAUM, BA
SNEZHKO, OM
SPEKTOR, YZ
YURYEV, GS
GELD, PV
PHYSICS OF METALS AND METALLOGRAPHY-USSR, 1970, 30 (04): : 110 - &
[10] STUDY OF POLYTYPISM IN SILICON CARBIDE BY X-RAY DIFFRACTION TOPOGRAPHY
WALLACE, CA
ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1968, 126 (5-6): : 444 - &

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