PRELIMINARY-ANALYSIS FOR HIGH-RESOLUTION IMAGING OF COMPOUND SEMICONDUCTORS

被引：0
|
作者：
GLAISHER, RW
SMITH, DJ
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：337 / 338
页数：2
相关论文
共 50 条
  • [41] SURFACE POLARITY DETERMINATION IN )110+-ORIENTATED COMPOUND SEMICONDUCTORS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    SMITH, DJ
    GLAISHER, RW
    LU, P
    PHILOSOPHICAL MAGAZINE LETTERS, 1989, 59 (02) : 69 - 75
  • [42] THE APPLICATIONS OF HIGH-RESOLUTION METHODS FOR ATOMIC AND ELECTRONIC-STRUCTURE ANALYSIS IN SEMICONDUCTORS
    SPENCE, JCH
    OLSEN, A
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (08) : C388 - C388
  • [43] High-resolution ultrsound imaging and volume imaging
    Tranquart, F.
    JOURNAL DE RADIOLOGIE, 2006, 87 (12): : 1919 - 1919
  • [44] COMPOUND REPRESENTATION OF HIGH-RESOLUTION SEA CLUTTER
    WARD, KD
    ELECTRONICS LETTERS, 1981, 17 (16) : 561 - 563
  • [45] Methods for Vectorial Analysis and Imaging in High-Resolution Laser Microscopy
    Marrocco, Michele
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 165, 2011, 165 : 131 - 173
  • [46] High-resolution imaging particle analysis of freshwater cyanobacterial blooms
    Graham, M. D.
    Cook, J.
    Graydon, J.
    Kinniburgh, D.
    Nelson, H.
    Pilieci, S.
    Vinebrooke, R. D.
    LIMNOLOGY AND OCEANOGRAPHY-METHODS, 2018, 16 (10): : 669 - 679
  • [47] LATTICE AND ATOMIC-STRUCTURE IMAGING OF SEMICONDUCTORS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
    OURMAZD, A
    AHLBORN, K
    IBEH, K
    HONDA, T
    APPLIED PHYSICS LETTERS, 1985, 47 (07) : 685 - 688
  • [48] High-resolution nondestructive patterning of isolated organic semiconductors
    Lo, Yi-Chen
    Li, Dawen
    Sun, Zhenzhong
    Shaik, Shoieb
    Cheng, Xing
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2012, 30 (06):
  • [49] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTORS AND METALS
    BULLELIEUWMA, CWT
    COENE, W
    DEJONG, AF
    ADVANCED MATERIALS, 1991, 3 (7-8) : 368 - 378
  • [50] Characterization of atherosclerotic plaques at the carotid bifurcation: Correlation of high-resolution MR imaging with histologic analysis - Preliminary study
    vonIngersleben, G
    Schmiedl, UP
    Hatsukami, TS
    Nelson, JA
    Subramaniam, DS
    Ferguson, MS
    Yuan, C
    RADIOGRAPHICS, 1997, 17 (06) : 1417 - 1423
12345