X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES

被引：4

作者：

FINDEISEN, E ^{[1
]}

BRUGEMANN, L ^{[1
]}

STETTNER, J ^{[1
]}

TOLAN, M ^{[1
]}

机构：

[1] CHRISTIAN ALBRECHTS UNIV KIEL,INST EXPTL PHYS,D-24098 KIEL,GERMANY

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1993年 / 5卷 / 44期

关键词：

D O I：

10.1088/0953-8984/5/44/008

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The intensity of Bragg reflections depends strongly on the angle of incidence, if a highly collimated beam of x-rays is impinging at grazing incidence on a thin (200-600 Angstrom) polycrystalline antimony layer. In the case of asymmetric grazing incidence diffraction (AGID) the angle of incidence is small, as the exit angle must be large and nearly twice the Bragg angle. The experimental data are analysed on the basis of the distorted wave born approximation (DWBA), which yields the thickness d and the optical constants delta and beta of the layer. These parameters are compared with those determined from total external reflection data.

引用

页码：8149 / 8158

页数：10

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