RESIDUAL-GAS ANALYSIS IN THE ISX-A TOKAMAK

被引:2
|
作者
SIMPKINS, JE
COLCHIN, RJ
OVERBEY, DR
机构
来源
关键词
D O I
10.1116/1.570079
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:763 / 765
页数:3
相关论文
共 50 条
  • [41] COMPUTER SOFTWARE PACKAGE FOR RESIDUAL-GAS ANALYZER
    SHOEMAKER, L
    FARDEN, J
    HOLKEBOER, D
    WILSON, T
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 184 - 185
  • [42] EXPERIENCE WITH SEVERAL QUADRUPOLE RESIDUAL-GAS ANALYZERS
    HSUEH, HC
    [J]. VACUUM, 1985, 35 (12) : 633 - 633
  • [43] ION CURRENT MODULATION OF A RESIDUAL-GAS ANALYZER
    WATANABE, F
    ISHIMARU, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (06): : 2192 - 2195
  • [44] EFFECT OF RESIDUAL-GAS ON WORK OF SUPERCONDUCTING RESONATOR
    KOROVIN, OP
    [J]. ZHURNAL TEKHNICHESKOI FIZIKI, 1977, 47 (11): : 2447 - 2448
  • [45] QUADRUPOLE MASS-SPECTROMETER FOR RESIDUAL-GAS ANALYSIS AND SIMS APPLICATION
    HARS, G
    SOLYOM, A
    GIBER, J
    [J]. FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 341 (1-2): : 57 - 59
  • [46] MEASUREMENT OF RESIDUAL CURRENTS IN IONIZATION GAUGES AND RESIDUAL-GAS ANALYZERS
    REDHEAD, PA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2665 - 2673
  • [47] NUMERICAL-SIMULATION OF ISX-A TUNGSTEN INJECTION EXPERIMENT
    AMANO, T
    CRUME, EC
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (07): : 772 - 772
  • [48] DETAILS OF CONFINEMENT EXPERIMENTS IN ISX-A - CHARGE-EXCHANGE
    WILGEN, JB
    MIHALCZO, JT
    NEILSON, GH
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (07): : 789 - 790
  • [49] RESIDUAL-GAS ADSORPTION ON ELECTRODE SURFACES IN VACUUM
    TSURUTA, K
    YANO, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (06): : 1017 - 1019
  • [50] PLASMA-INDUCED RESIDUAL-GAS TRANSIENTS
    MIODUSZEWSKI, PK
    SIMPKINS, JE
    UCKAN, T
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 2008 - 2009