THERMAL-CHANGE OF SNI2 THIN-FILMS .1. THERMOGRAVIMETRY

被引：14
|
作者：
SAWADA, Y
SUZUKI, M
机构：
[1] Department of Industrial Chemistry, Faculty of Engineering, Tokyo Institute of Polytechnics, Atsugi-shi, Kanagawa, 243-02
来源：
THERMOCHIMICA ACTA | 1994年 / 232卷 / 01期
关键词：
D O I：
10.1016/0040-6031(94)80042-1
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
Thermal change of tin iodide (SnI2) evaporated film as-deposited on a glass substrate has been successfully detected by TG (heating rate, 10-degrees-C/min-1) film mass about 0.5 mg, film area about 2 cm2. A mass loss at 260-420-degrees-C in an argon flow is attributed to the evaporation of SnI2. A mass loss at 180-290-degrees-C in an air flow is interpreted as oxidation of SnI2 to form SnI4 vapor and tin oxide. The TG-DTA for SnI2 and SnI4 powders in a nitrogen flow (heating rate, 10-degrees-C min have been performed to understand the thermal change of SnI2 thin films; an endothermic phenomenon without mass change attributed to melting at 319 and 144-degrees-C and an endothermic mass loss attributed to evaporation at 300-460 and 85-190-degrees-C were observed for SnI2 and SnI4 powders, respectively. A small mass loss (about 7%) at 85-150-degrees-C for SnI2 powders is attributed to the evaporation of SnI4 impurity.
引用
收藏
页码：29 / 36
页数：8
相关论文
共 50 条
  • [21] RETRACTED: Fabrication and characterization of Cs2SnI6 perovskite films using SnI2 and I2 powders as reactants (Retracted Article)
    Ullah, Saad
    Yang, Peixin
    Abbas, Ghulam
    Chen, Yongsheng
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2022, 33 (04) : 2257 - 2257
  • [22] THERMAL-CONDUCTIVITY OF THIN-FILMS
    BAIER, V
    VOLKLEIN, F
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1990, 118 (02): : K69 - K71
  • [23] THERMAL-CONDUCTIVITY OF THIN-FILMS
    VIGDOROVICH, VN
    GARANIN, VP
    UKHLINOV, GA
    INDUSTRIAL LABORATORY, 1979, 45 (05): : 545 - 547
  • [24] THERMAL RESISTIVITY OF SIOX THIN-FILMS
    STEELE, CB
    BEYNON, J
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1992, 11 (20) : 1338 - 1339
  • [25] DEFORMATION IN THIN-FILMS BY THERMAL STRAIN
    MURAKAMI, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (04): : 2469 - 2476
  • [26] PHOTOELECTROCHEMISTRY OF ELECTRODEPOSITED POLYCRYSTALLINE CUINSE2 THIN-FILMS .1. ELECTRODEPOSITION OF CUINSE2 FILMS
    WANG, JS
    TAN, Z
    MI, TY
    SUN, GQ
    SCIENCE IN CHINA SERIES B-CHEMISTRY, 1992, 35 (03): : 281 - 290
  • [27] OPTICAL INVESTIGATIONS ON INXSE1-X THIN-FILMS .1.
    ABDELMOIZ, AB
    PHYSICA B, 1993, 191 (3-4): : 293 - 302
  • [28] ELECTRODEPOSITION OF THIN-FILMS OF NICKEL-IRON .1. EXPERIMENTAL
    GRANDE, WC
    TALBOT, JB
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (03) : 669 - 674
  • [29] OPTICAL THIN-FILMS WITH A PERIODIC STRUCTURE .1. CHARACTERISTIC FUNCTIONS
    MOUCHART, J
    APPLIED OPTICS, 1981, 20 (24): : 4201 - 4206
  • [30] QUANTITATIVE STRUCTURAL AND CHEMICAL-ANALYSIS OF THIN-FILMS .1.
    BRUYNSERAEDE, Y
    SCHULLER, IK
    MRS BULLETIN, 1992, 17 (12) : 20 - &
12345