PARTICLE-SIZE AND ITS EFFECT ON PRECISION OF ANALYSIS BY X-RAY-DIFFRACTION OF THIN-LAYERS OF QUARTZ

被引：0

作者：

LEROUX, J ^{[1
]}

PERRAULT, G ^{[1
]}

DAVEY, ABC ^{[1
]}

机构：

[1] MINIST SANTE NATL & BIEN ETRE SOC,DIRECTION HYG MILIEU,OTTAWA,ONTARIO,CANADA

来源：

CANADIAN JOURNAL OF SPECTROSCOPY | 1973年 / 18卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：46 / 49

页数：4

共 50 条

[41] ANALYSIS OF THE STRAIN PROFILE IN THIN AU/NI MULTILAYERS BY X-RAY-DIFFRACTION
CHAUDHURI, J
GONDHALEKAR, V
JANKOWSKI, AF
JOURNAL OF APPLIED PHYSICS, 1992, 71 (08) : 3816 - 3820
[42] X-RAY-DIFFRACTION ANALYSIS OF LOW MISMATCH EPITAXIAL LAYERS GROWN ON MISORIENTED SUBSTRATES
GAILHANOU, M
CARLIN, JF
OESTERLE, U
JOURNAL OF CRYSTAL GROWTH, 1994, 140 (1-2) : 205 - 212
[43] X-RAY-DIFFRACTION ANALYSIS OF NITROGEN IMPLANTED SURFACE-LAYERS OF IRON AND STEEL
LING, GW
ZHANG, XZ
LI, HD
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 22 (04): : 504 - 508
[44] Automated soil particle-size analysis using X-ray absorption
Vitton, SJ
Ott, NL
Lehman, MA
NONDESTRUCTIVE AND AUTOMATED TESTING FOR SOIL AND ROCK PROPERTIES, 1999, 1350 : 69 - 82
[45] PARTICLE-SIZE EFFECTS IN THE X-RAY-FLUORESCENCE ANALYSIS OF MONOLAYER SAMPLES
KRASNOPOLSKAYA, NN
VOLKOV, VF
X-RAY SPECTROMETRY, 1986, 15 (01) : 3 - 6
[46] Automated soil particle-size analysis using X-ray absorption
Dept. of Civ. and Environ. Eng., Michigan Technological University, 1400 Townsend Drive, Houghton, MI 49931, United States
不详
不详
ASTM Spec Tech Publ, 1350 (69-82):
[47] QUANTITATIVE-DETERMINATION OF QUARTZ IN CALCITE, DOLOMITE, AND TALC BY POWDER X-RAY-DIFFRACTION ANALYSIS
TOMAINO, GP
ANALYTICA CHIMICA ACTA, 1994, 286 (01) : 75 - 80
[48] EFFECT OF ANOMALOUS SCATTERING ON X-RAY-DIFFRACTION LINE PROFILE ANALYSIS
MITRA, GB
MISRA, NK
ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S173 - S173
[49] QUANTITATIVE-ANALYSIS OF QUARTZ AND CRISTOBALITE IN BENTONITE CLAY BASED PRODUCTS BY X-RAY-DIFFRACTION
CARTER, JR
HATCHER, MT
DICARLO, L
ANALYTICAL CHEMISTRY, 1987, 59 (03) : 513 - 519
[50] EFFECT OF THE SAMPLE PREPARATION TECHNIQUE ON THE RESULTS OF X-RAY-DIFFRACTION ANALYSIS
FETISOV, GV
ZHUKOV, SG
KRISTALLOGRAFIYA, 1992, 37 (04): : 874 - 881

← 1 2 3 4 5 →