STATISTICAL IMAGE-RESTORATION

被引：0
|
作者：
DUBONOS, SN
GAIFULLIN, BN
USHAKOV, NG
机构：
[1] Institute of Problems of Microelectronics Technology and Superpure Materials, USSR Academy of Sciences, 142432 Chernogolovka, Moscow discrict
来源：
COMPUTERS & MATHEMATICS WITH APPLICATIONS | 1990年 / 19卷 / 01期
关键词：
D O I：
10.1016/0898-1221(90)90080-4
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
Restoration of very noisy images typical of electron-beam diagnostics of microelectronics is considered. The conditions, under which the regularization method yields strongly consistent (with probability 1) estimates of image functions are investigated. The problems of the choice of stabilizing functional and numerical computer realization are discussed. © 1990.
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页码：39 / 45
页数：7
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