ELECTRICAL MEASUREMENTS IN SILICON UNDER SHOCK-WAVE COMPRESSION

被引：23
|
作者：
COLEBURN, NL [1 ]
FORBES, JW [1 ]
JONES, HD [1 ]
机构：
[1] USN,ORD LAB,SILVER SPRING,MD 20910
来源：
JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 12期
关键词：
D O I：
10.1063/1.1661061
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5007 / 5012
页数：6
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