ELECTRICAL MEASUREMENTS IN SILICON UNDER SHOCK-WAVE COMPRESSION

被引：23

|

作者：

COLEBURN, NL ^{[1
]}

FORBES, JW ^{[1
]}

JONES, HD ^{[1
]}

机构：

[1] USN,ORD LAB,SILVER SPRING,MD 20910

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 12期

关键词：

D O I：

10.1063/1.1661061

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：5007 / 5012

页数：6

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