RESOLUTION AND QUALITY OF IMAGE IN SEM

被引：0

作者：

KATAYAMA, Y ^{[1
]}

SOEZIMA, H ^{[1
]}

MASAKI, T ^{[1
]}

机构：

[1] SHIMADZU SEISAKUSHO LTD,KYOTO,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：285 / 285

页数：1

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