共 50 条
- [32] X-RAY SPECTROMETERS WITH DIFFRACTIONAL FOCUSING [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 43 (02): : 399 - 406
- [33] IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers [J]. ANSI/IEEE Std 759-1984, 1984, : 1 - 52
- [34] Calibration of binding-energy scales of x-ray photoelectron spectrometers [J]. SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 287 - 292
- [36] CADMIUM TELLURIDE FOR LOW-ENERGY GAMMA-RAY AND X-RAY SPECTROMETERS [J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 98 (03): : 597 - &
- [40] The advantages of soft X-rays and cryogenic spectrometers for measuring chemical speciation by X-ray spectroscopy [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 559 (02): : 728 - 730