BUILT-IN SELF-TEST OF A CMOS ALU

被引：0
|
作者：
CERNY, E
ABOULHAMID, M
BOIS, G
CLOUTIER, J
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1988年 / 5卷 / 04期
关键词：
D O I：
10.1109/54.7968
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：38 / 48
页数：11
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