COMPARISON OF FULL-WAVE APPROACHES FOR DETERMINATION OF MICROSTRIP CONDUCTOR LOSSES FOR MMIC APPLICATIONS

被引：14
|
作者：
PALECZNY, E
KINOWSKI, D
LEGIER, JF
PRIBETICH, P
KENNIS, P
机构：
[1] Centre Hyperfréquence et Semiconducteurs U.A. CNRS no. 287, Equipe Electromagnétisme des Circuits, 59655 Villeneuve d'Ascq Cedex
来源：
ELECTRONICS LETTERS | 1990年 / 26卷 / 25期
关键词：
Losses; Microstrip;
D O I：
10.1049/el:19901338
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Losses due to ohmic conductors in planar lines are evaluated by two full wave analyses, the first one using the impedance surface concept associated with the modified spectral domain approach (SDA) and the second a more accurate mode matching technique. To state the respective validity domain of the two numerical simulations, results are compared to experimental data. © 1990, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码：2076 / 2077
页数：2
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