A NONSTATIONARY METHOD FOR MEASURING THE ELECTRICAL CONDUCTIVITY AND CONTACT RESISTANCE OF SEMICONDUCTORS

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作者：

KAGANOV, MA

LISKER, IS

机构：

来源：

INDUSTRIAL LABORATORY | 1960年 / 26卷 / 10期

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暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

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页码：1296 / 1301

页数：6

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