AC SIDEGATING IN GAAS-MESFETS

被引:2
|
作者
SHULMAN, D
YOUNG, L
机构
[1] Department of Electrical Engineering, University of British Columbia, Vancouver
关键词
D O I
10.1016/0038-1101(91)90069-B
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The bias and frequency dependence of a.c. sidegating in GaAs MESFETs was modeled using a distributed R-C network. The resultant analytic expression for the sidegate transconductance was compared with experimental results over the range of 100 Hz-100 kHz. They agreed in that the sidegating at small drain-source voltage exhibits a maximum as a function of gate bias, while at large drain-source voltage the sidegating increases and eventually saturates with gate voltage, and is not sensitive to drain-source voltage. The present experimental measurements show that a.c. sidegating (like d.c.) is greatly enhanced after a negatively-biased sidegate reaches a threshold. Both experimental data and the model show that a.c. sidegating increases approximately as w1/2 at high frequencies.
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页码:1281 / 1287
页数:7
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