AN INFRARED SPECTROSCOPIC STUDY OF VACUUM-EVAPORATED SIO-CEO2 THIN-FILMS

被引：10
|
作者：
SINGH, A
HOGARTH, CA
机构：
来源：
JOURNAL OF MATERIALS SCIENCE | 1988年 / 23卷 / 03期
关键词：
D O I：
10.1007/BF01154018
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1090 / 1097
页数：8
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