AN INFRARED SPECTROSCOPIC STUDY OF VACUUM EVAPORATED AMORPHOUS THIN-FILMS OF MOO3-SIO

被引：0

作者：

ANWAR, M ^{[1
]}

HOGARTH, CA ^{[1
]}

THEOCHARIS, CR ^{[1
]}

机构：

[1] BRUNEL UNIV,DEPT CHEM,UXBRIDGE UB8 3PH,MIDDX,ENGLAND

来源：

JOURNAL OF MATERIALS SCIENCE | 1990年 / 25卷 / 2A期

关键词：

Amorphous Thin Films - Mixed Thin Films - Vacuum Evaporation;

D O I：

10.1007/BF03372211

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1108 / 1111

页数：4

共 50 条

[1] AN INFRARED SPECTROSCOPIC STUDY OF VACUUM-EVAPORATED SIO-CEO2 THIN-FILMS
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[3] ELECTRON-SPIN RESONANCE STUDY OF THERMALLY EVAPORATED AMORPHOUS THIN-FILMS OF MOO3 SIO
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[4] INFRARED SPECTROSCOPIC STUDY OF VACUUM-EVAPORATED SiO-CeO2 THIN FILMS.
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[6] THE CORRELATION OF VARIOUS PROPERTIES OF THIN-FILMS OF MOO3 AND OF THE MIXED-OXIDE SYSTEMS MOO3-IN2O3 AND MOO3-SIO
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[7] OPTICAL-PROPERTIES OF AMORPHOUS THIN-FILMS OF MOO3 DEPOSITED BY VACUUM EVAPORATION
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[8] VACUUM EVAPORATED THIN-FILMS FOR SOLAR COLLECTORS
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[9] THIN-FILMS OF AMORPHOUS MOO3 AS A NEGATIVE RESIST
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[10] Infrared characterisation of evaporated SiO thin films
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