EXCHANGE BIAS IN MNFE/NIFE THIN-FILM STRUCTURES

被引：0
|
作者：
RUSSAK, MA [1 ]
ROSSNAGEL, SM [1 ]
SCILLA, GJ [1 ]
COHEN, SL [1 ]
MCGUIRE, TR [1 ]
CUOMO, JJ [1 ]
BAKER, JM [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1987年 / 134卷 / 8B期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C475 / C475
页数：1
相关论文
共 50 条
  • [11] Exchange bias in spin glass (FeAu)/NiFe thin films
    Yuan, Fu-Te
    Lin, Jeng-Kai
    Yao, Y. D.
    Lee, Shang-Fan
    APPLIED PHYSICS LETTERS, 2010, 96 (16)
  • [12] Exchange bias and magnetotransport properties in IrMn/NiFe/FeMn structures
    Guo, Z. B.
    Wu, Y. H.
    Qiu, J. J.
    Zong, B. Y.
    Han, G. C.
    PHYSICAL REVIEW B, 2008, 78 (18):
  • [13] THIN-FILM SUPERCONDUCTOR IN AN EXCHANGE FIELD
    HAO, X
    MOODERA, JS
    MESERVEY, R
    PHYSICAL REVIEW LETTERS, 1991, 67 (10) : 1342 - 1345
  • [14] Temperature-dependent magnetization reversal in exchange bias NiFe/IrMn/NiFe structures
    Gritsenko, Ch
    Dzhun, I
    Volochaev, M.
    Gorshenkov, M.
    Babaytsev, G.
    Chechenin, N.
    Sokolov, A.
    Tretiakov, Oleg A.
    Rodionova, V
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2019, 482 : 370 - 375
  • [15] Interlayer exchange coupling in amorphous/crystalline NiFe2O4 thin-film bilayers
    Korenivski, V.
    van Dover, R.B.
    Suzuki, Y.
    Gyorgy, E.M.
    Phillips, J.M.
    Felder, R.J.
    Journal of Applied Physics, 1996, 79 (8 pt 2B):
  • [16] Interlayer exchange coupling in amorphous/crystalline NiFe2O4 thin-film bilayers
    Korenivski, V
    vanDover, RB
    Suzuki, Y
    Gyorgy, EM
    Phillips, JM
    Felder, RJ
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) : 5926 - 5928
  • [17] Exchange bias in NiFe/FeMn/NiFe trilayers
    Kim, C.G. (cgkim@cnu.ac.kr), 1600, American Institute of Physics Inc. (96):
  • [18] Observation of Static Domain Structures of Thin-Film Magnetoimpedance Elements With DC Bias Current
    Kikuchi, H.
    Sumida, C.
    IEEE TRANSACTIONS ON MAGNETICS, 2019, 55 (02)
  • [19] Exchange bias in NiFe/FeMn/NiFe trilayers
    Sankaranarayanan, VK
    Yoon, SM
    Kim, DY
    Kim, CO
    Kim, CG
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (12) : 7428 - 7434
  • [20] GROWTH OF EUTECTIC THIN-FILM STRUCTURES
    CLINE, HE
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) : 5898 - 5903
12345