EXCHANGE BIAS IN MNFE/NIFE THIN-FILM STRUCTURES

被引:0
|
作者
RUSSAK, MA [1 ]
ROSSNAGEL, SM [1 ]
SCILLA, GJ [1 ]
COHEN, SL [1 ]
MCGUIRE, TR [1 ]
CUOMO, JJ [1 ]
BAKER, JM [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:C475 / C475
页数:1
相关论文
共 50 条
  • [1] Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film
    Yoo, Yong-Goo
    Min, Seong-Gi
    Ryu, Ho-Jun
    Park, Nam-Seok
    Yu, Seong-Cho
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2006, 303 (02) : E188 - E191
  • [2] MNFE AND NIFE THIN-FILMS AND MAGNETIC EXCHANGE BILAYERS
    RUSSAK, MA
    ROSSNAGEL, SM
    COHEN, SL
    MCGUIRE, TR
    SCILLA, GJ
    JAHNES, CV
    BAKER, JM
    CUOMO, JJ
    HWANG, C
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (06) : 1793 - 1798
  • [3] Exchange bias of patterned NiFe/IrMn film
    Shen, YT
    Wu, YH
    Xie, H
    Li, KB
    Qiu, JJ
    Guo, ZB
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 91 (10) : 8001 - 8003
  • [4] MNFE STRUCTURE-EXCHANGE ANISOTROPY RELATION IN THE NIFE/MNFE/NIFE SYSTEM
    KUNG, KTY
    LOUIE, LK
    GORMAN, GL
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (08) : 5634 - 5636
  • [5] SUPERCONDUCTING THIN-FILM STRUCTURES
    KOTLYARCHUK, BK
    POPOVICH, DM
    FLIS, AA
    FLIS, VS
    [J]. SOVIET POWDER METALLURGY AND METAL CERAMICS, 1990, 29 (11): : 921 - 923
  • [6] POLARIZABILITY OF A BIAS-TEMPERATURE DRIFTED SPECIES IN THIN-FILM TRANSISTOR STRUCTURES
    WEBB, JB
    BRODIE, DE
    [J]. CANADIAN JOURNAL OF PHYSICS, 1972, 50 (10) : 1023 - &
  • [7] Dependence of exchange bias in NiFe/NiO bilayers on film thickness
    Fermin, Jose R.
    [J]. REVISTA MEXICANA DE FISICA, 2017, 63 (02) : 145 - 150
  • [8] STRAY FIELD INTERACTION IN PTCO/SIO2/NIFE MULTILAYER THIN-FILM STRUCTURES
    HILL, EW
    MCCULLOUGH, AM
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 1988, 24 (02) : 1707 - 1709
  • [9] Exchange bias anisotropy on the dynamic permeability of thin NiFe layers
    Queste, S
    Dubourg, S
    Acher, O
    Barholz, KU
    Mattheis, R
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 95 (11) : 6873 - 6875
  • [10] Exchange bias anisotropy on the dynamic permeability of thin NiFe layers
    [J]. Queste, S. (samuel.queste@cea.fr), 1600, American Institute of Physics Inc. (95):